• DocumentCode
    340493
  • Title

    The Mondo Chip-A CMOS integrated circuit for the PHENIX electromagnetic calorimeter

  • Author

    Wintenberg, A.L. ; Belikov, S. ; Ericson, M.N. ; Frank, S.S. ; Jackson, R.G. ; Jones, J.P., Jr. ; Simpson, M.L. ; Stankus, P.W. ; Young, G.R.

  • Author_Institution
    Oak Ridge Nat. Lab., TN, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    29
  • Abstract
    A four-channel multi-function CMOS integrated circuit designated as the Mondo Chip has been developed for the PHENIX electromagnetic calorimeter. Each channel of the Mondo Chip has an energy measurement circuit with a 14-bit dynamic range, a timing measurement circuit with a range of 100 ns, nominal resolution of 50 ps and uncertainty of less than 200 ps rms, and a programmable calibration circuit. The IC also includes several analog energy-summing circuits and thresholding circuits whose outputs are used by the experiment trigger and are live for every bunch crossing. All needed adjustments and optional settings are accomplished using a serial interface and on-chip DACs and registers. Details of the design and results from extensive testing of a set of prototype devices are presented
  • Keywords
    CMOS digital integrated circuits; calorimeters; digital-analogue conversion; nuclear electronics; programmable circuits; solid scintillation detectors; timing circuits; 100 ps; 200 ps; 50 ps; CMOS integrated circuit; DACs; Mondo Chip; PHENIX electromagnetic calorimeter; analog energy-summing circuits; energy measurement circuit; programmable calibration circuit; registers; serial interface; thresholding circuits; timing measurement circuit; Analog integrated circuits; CMOS integrated circuits; Calibration; Dynamic range; Electromagnetic measurements; Energy measurement; Energy resolution; Integrated circuit measurements; Semiconductor device measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.774802
  • Filename
    774802