• DocumentCode
    3404987
  • Title

    Bayes optimal kernel discriminant analysis

  • Author

    You, Di ; Martinez, Aleix M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    3533
  • Lastpage
    3538
  • Abstract
    Kernel methods provide an efficient mechanism to derive nonlinear algorithms. In classification problems as well as in feature extraction, kernel-based approaches map the originally nonlinearly separable data into a space of intrinsically much higher dimensionality where the data is linearly separable and can be readily classified with existing and efficient linear methods. For a given kernel function, the main challenge is to determine the parameters of the kernel which maps the original nonlinear problem to a linear one. This paper derives a Bayes optimal criterion for the selection of the kernel parameters in discriminant analysis. Our criterion selects the kernel parameters that maximize the (Bayes) classification accuracy in the kernel space. We also show how we can use the same criterion to do subclass selection in the kernel space for problems with multimodal class distributions. Extensive experimental evaluation demonstrates the superiority of the proposed criterion over the state of the art.
  • Keywords
    Bayes methods; feature extraction; linear algebra; nonlinear equations; pattern classification; statistical analysis; Bayes optimal kernel discriminant analysis; classification accuracy; classification problems; dimensionality; feature extraction; kernel parameters; kernel space; linear methods; multimodal class distributions; nonlinear algorithms; nonlinearly separable data; Algorithm design and analysis; Covariance matrix; Data analysis; Face recognition; Feature extraction; Kernel; Linear discriminant analysis; Scattering parameters; Text analysis; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5539952
  • Filename
    5539952