Title :
Recommended EMI test procedures for MMICs
Author :
Farris, Brian ; Rohrbaugh, John
Author_Institution :
Georgia Tech. Res. Inst., Atlanta, GA, USA
Abstract :
Recommended EMI (electromagnetic interference) tests were developed which can be performed early in the MMIC (monolithic microwave integrated circuit) development cycle. These tests can aid the designer in developing EMI-tolerant devices and systems. Recommended tests are described for microwave input and output pins, digital and analog control pins, and power and ground pins. Measurements at wafer, packaged chip, and system levels of fabrication are addressed as well. It is pointed out that conducted interference measurements should be performed early in the design cycle as part of design proof and qualification tests. Redesigns of devices should be requalified for EMI performance to verify that the redesigns have not adversely affected EMI performance
Keywords :
MMIC; electromagnetic interference; integrated circuit testing; EMI test procedures; EMI-tolerant devices; MMIC design; analog control pins; conducted interference measurements; design cycle; design proof; digital control pins; electromagnetic interference; ground pin; microwave input; microwave output; monolithic microwave integrated circuit; packaged chip level; power pin; qualification tests; system levels; wafer level; Circuit testing; Electromagnetic interference; Integrated circuit testing; MMICs; Microwave devices; Microwave integrated circuits; Monolithic integrated circuits; Performance evaluation; Pins; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.1990.252743
