• DocumentCode
    3405604
  • Title

    The nature of bulk charging and its mitigation in spacecraft design

  • Author

    Vampola, A.L.

  • Author_Institution
    Space Environ. Effects, Torrance, CA, USA
  • fYear
    1996
  • fDate
    22-24 Oct 1996
  • Firstpage
    268
  • Lastpage
    273
  • Abstract
    Bulk charging, in which energetic electrons embed within bulk dielectrics or isolated conductors such as spot shields, building up to potentials in excess of the breakdown potential of the local region, is known to be a causative factor in anomalous operation of high attitude satellites. The mechanism and methods of ameliorating its effects are discussed. A table of maximum expected electron flux spectra as a function of L is presented. Consideration of these maximum fluxes end the fact that the energy associated with a bulk dielectric breakdown is small indicates that bulk charging can be eliminated as a spacecraft problem through shielding (700 mg/cm2) of all cables and circuit boards otherwise exposed to the environment, through providing conductive paths (<109 ohms) for otherwise isolated metallic elements, and through desensitizing digital logic inputs which are serviced by cables
  • Keywords
    artificial satellites; cable sheathing; digital circuits; electric breakdown; electron spectra; electrostatic discharge; printed circuits; protection; spacecraft charging; 10E7 ohm; anomalous operation; breakdown potential; bulk charging; bulk dielectrics; cables; circuit boards; conductive paths; dielectric breakdown; digital logic inputs; electron flux spectra; electron spectra; energetic electrons; high attitude satellites; isolated conductors; isolated metallic elements; mitigation; shielding; spacecraft design; spot shields; Cables; Capacitance; Conducting materials; Conductivity; Dielectric breakdown; Dielectric materials; Dielectric substrates; Electrons; Space vehicles; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    WESCON/96
  • Conference_Location
    Anaheim, CA
  • ISSN
    1095-791X
  • Print_ISBN
    0-7803-3274-1
  • Type

    conf

  • DOI
    10.1109/WESCON.1996.553999
  • Filename
    553999