Title :
Estimating the uncertainty in passive-microwave rain-retrievals
Author :
Coppens, Dorothtée ; Haddad, Ziad ; Im, Eastwood
Author_Institution :
California Inst. of Technol., Pasadena, CA, USA
Abstract :
Current passive-microwave rain-retrieval methods are largely based on databases built off-line using cloud models. The vertical distribution of hydrometeors within the cloud has a large impact on upwelling brightness temperatures. Thus, a forward radiative transfer model can predict off-line the radiance associated with different rain scenarios. To estimate the rain from measured brightness temperatures, one simply looks for the rain scenario whose associated radiances are closest to the measurements. To understand the uncertainties in this process, the authors first study the dependence of the simulated brightness temperatures on different hydrometeor size distribution (DSD) models. They then analyze the marginal and joint distributions of the radiances observed by the Tropical Rainfall Measuring Mission satellite and of those in the databases used in the TRMM rain retrievals. They finally calculate the covariances of the rain profiles and brightness temperatures in the TRMM passive-microwave database and derive a simple parametric model for the conditional uncertainty, given measured radiances. These results are used to characterize the uncertainty inherent in the passive-microwave retrieval
Keywords :
atmospheric techniques; radiometry; rain; remote sensing; TRMM; Tropical Rainfall Measuring Mission; atmosphere; brightness temperature; forward radiative transfer model; hydrometeor size distribution; joint distribution; measurement technique; meteorology; microwave radiometry; passive method; rain; rain scenario; rain-retrieval; rainfall; remote sensing; uncertainty; Brightness temperature; Clouds; Databases; Information retrieval; Parametric statistics; Predictive models; Rain; Satellites; Temperature measurement; Uncertainty;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
Conference_Location :
Hamburg
Print_ISBN :
0-7803-5207-6
DOI :
10.1109/IGARSS.1999.775031