A study of the repeatability of electrostatic discharge simulators

Author

Maas, John ; Pratt, Daniel

Author_Institution

IBM Application Bus. Syst., Rochester, MN, USA

fYear

1990

fDate

21-23 Aug 1990

Firstpage

265

Lastpage

269

Abstract

The repeatability of electrostatic discharge (ESD) testing using commercially available, lumped capacitance ESD simulators is examined. The pulse generated by the simulator and the indirect application of discharges using a flat, metallic coupling plane are studied. Some of the parameters that may affect repeatability are the angle between the simulator and the test sample or coupling plane, location of the discharge on the coupling plane, and the location of the simulator´s ground return cable. It is concluded that using a lumped element ESD simulator and a flat metal plate is a viable method of testing an electronic product to determine its immunity to indirect ESD

Keywords

electronic equipment testing; electrostatic discharge; test equipment; ESD testing; electronic product testing; electrostatic discharge simulators; flat metal plate; lumped capacitance ESD simulators; repeatability; Biological system modeling; Blades; Capacitance; Capacitors; Circuit simulation; Circuit testing; Electrostatic discharge; Fault location; Humans; Immune system;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-7264-6

Type

conf

DOI

10.1109/ISEMC.1990.252771

Filename

252771