• DocumentCode
    3405783
  • Title

    Diagnostic effectiveness in computer systems using deterministic random ESD

  • Author

    Nick, Howard ; Osborn, Brock ; Wu, Chang

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • fYear
    1990
  • fDate
    21-23 Aug 1990
  • Firstpage
    274
  • Lastpage
    279
  • Abstract
    A new criterion for electrostatic discharge (ESD) testing was recently developed where qualification effectiveness for a given apparatus is shown to be a function of the coverage obtained through ESD event coincidence with the diagnostic software/hardware in use. The authors show the effectiveness of ESD testing on a large-scale computer system undergoing testing in a typical manufacturing environment using both the present, industry accepted, deterministic ESD unit and an ESD unit based upon the recently established criterion. In addition, they provide guidelines for maximizing error detection and fault isolation as a function of ESD events and diagnostic software coverage. They further provide results showing the fallacy of assuming that a deterministic ESD unit will eventually cover every segment of a similarly deterministic diagnostic routine given unconstrained runtime. They also show the attainment of 100% diagnostic coverage in all cases based upon a 0.9 confidence using a randomly exercised ESD unit
  • Keywords
    DP management; computer installation; computer testing; electrostatic discharge; ESD events; ESD testing; computer systems; deterministic random ESD; diagnostic effectiveness; diagnostic software coverage; electrostatic discharge; error detection; fault isolation; manufacturing environment; Computer aided manufacturing; Computer industry; Electrostatic discharge; Guidelines; Hardware; Large-scale systems; Manufacturing industries; Qualifications; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1990.252773
  • Filename
    252773