DocumentCode
3405783
Title
Diagnostic effectiveness in computer systems using deterministic random ESD
Author
Nick, Howard ; Osborn, Brock ; Wu, Chang
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
fYear
1990
fDate
21-23 Aug 1990
Firstpage
274
Lastpage
279
Abstract
A new criterion for electrostatic discharge (ESD) testing was recently developed where qualification effectiveness for a given apparatus is shown to be a function of the coverage obtained through ESD event coincidence with the diagnostic software/hardware in use. The authors show the effectiveness of ESD testing on a large-scale computer system undergoing testing in a typical manufacturing environment using both the present, industry accepted, deterministic ESD unit and an ESD unit based upon the recently established criterion. In addition, they provide guidelines for maximizing error detection and fault isolation as a function of ESD events and diagnostic software coverage. They further provide results showing the fallacy of assuming that a deterministic ESD unit will eventually cover every segment of a similarly deterministic diagnostic routine given unconstrained runtime. They also show the attainment of 100% diagnostic coverage in all cases based upon a 0.9 confidence using a randomly exercised ESD unit
Keywords
DP management; computer installation; computer testing; electrostatic discharge; ESD events; ESD testing; computer systems; deterministic random ESD; diagnostic effectiveness; diagnostic software coverage; electrostatic discharge; error detection; fault isolation; manufacturing environment; Computer aided manufacturing; Computer industry; Electrostatic discharge; Guidelines; Hardware; Large-scale systems; Manufacturing industries; Qualifications; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-7264-6
Type
conf
DOI
10.1109/ISEMC.1990.252773
Filename
252773
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