• DocumentCode
    340595
  • Title

    Observation of scattering and emission from fluctuating, rough surface of water basin by using a system of scatterometer-radiometer at X band

  • Author

    Jin, Ya-Qiu ; Yao, Chuan-Liang ; Zhang, Nan-Xiong ; Chen, Xiao-Guang ; Zheng, Fu-Hai

  • Author_Institution
    WSRSC, Fudan Univ., Shanghai, China
  • Volume
    4
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2194
  • Abstract
    A system of combined scatterometer and radiometer at the X-band is developed at the WSRSC. It is employed to simultaneously observe the polarized backscattering and brightness temperature from randomly-perturbed, rough surface of the water basin. Randomly rough surface of water basin with the Pierson spectrum and different surface height are generated by the mechanical driver. Polarized backscattering (p,q=v,h) and brightness temperature TBp(p=v,h) for different incident angles and surface heights are measured. It might be used to mimic random sea surface driven by sea surface winds. Functional dependence of σpq and TBp upon incident angle, surface height and other parameters are obtained. By using the two-scale model of rough sea surface, numerical simulation of σ pq and TBp are also discussed comparing with the measurements
  • Keywords
    backscatter; ocean waves; oceanographic techniques; radar cross-sections; radar theory; radiometry; remote sensing; remote sensing by radar; Pierson spectrum; SHF; X-band; brightness temperature; incident angle; measurement technique; microwave emission; microwave radiometry; numerical simulation; ocean; ocean wave; polarized backscattering; radar remote sensing; radar scattering; radar scatterometry; random surface; randomly-perturbed surface; remote sensing; rough surface; sea surface; two-scale model; Backscatter; Brightness temperature; Ocean temperature; Polarization; Radar measurements; Rough surfaces; Scattering; Sea measurements; Sea surface; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
  • Conference_Location
    Hamburg
  • Print_ISBN
    0-7803-5207-6
  • Type

    conf

  • DOI
    10.1109/IGARSS.1999.775074
  • Filename
    775074