• DocumentCode
    340596
  • Title

    Dependence of backscattering enhancement from randomly very rough surfaces

  • Author

    Hsieh, Chin-Yuan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Kaohsiung Inst. of Marine Tech., Taiwan
  • Volume
    4
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2197
  • Abstract
    The recent observations of surface backscattering enhancement phenomenon from randomly rough Gaussian surfaces with large slopes were reported experimentally and stimulated the critical discussions. In this paper the IEM model with multiple scattering and suitable shadowing function (IEMMS) is developed to be able to predict this phenomenon of backscattering enhancement. The backscattering enhancement may take place when the surface rms slope is of the order of unity and large rms height. Also, the backscattering enhancement can also be predicted from the multiple surface scattering from a very roughly random surface. To the best of the author´s acknowledge, this is the first attempt to set up a fully integration equation model for fully theoretical polarized scattering. The derivation of basic surface. Scattering model is provided and a computer simulation is also provided to compare the experimental measurement
  • Keywords
    backscatter; geophysical techniques; radar cross-sections; radar theory; random media; remote sensing by radar; rough surfaces; terrain mapping; IEM model; backscatter; backscattering enhancement; geophysical measurement technique; land surface; large slope; multiple scattering; radar remote sensing; radar scattering; random surface; randomly very rough surface; rough Gaussian surface; shadowing function; terrain mapping; Backscatter; Dielectric measurements; Frequency; Integral equations; Magnetic field measurement; Optical scattering; Predictive models; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
  • Conference_Location
    Hamburg
  • Print_ISBN
    0-7803-5207-6
  • Type

    conf

  • DOI
    10.1109/IGARSS.1999.775075
  • Filename
    775075