DocumentCode :
3406045
Title :
Multilinear feature extraction and classification of multi-focal images, with applications in nematode taxonomy
Author :
Liu, Min ; Roy-Chowdhury, Amit K.
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
2823
Lastpage :
2830
Abstract :
In this paper, we present a 3D X-Ray Transform based multilinear feature extraction and classification method for Digital Multi-focal Images (DMI). In such images, morphological information for a transparent specimen can be captured in the form of a stack of high-quality images, representing individual focal planes through the specimen´s body. We present a method that can effectively exploit the entire information in the stack using the 3D X-Ray projections at different viewing angles. These DMI stacks represent the effect of different factors - shape, texture, viewpoint, different instances within the same class and different classes of specimens. For this purpose, we embed the 3D X-Ray Transform within a multilinear framework and propose a Multilinear X-Ray Transform (MXRT) feature representation. By combining the tensor texture and shape information we can get better recognition rates than just relying on the original or key frames of DMI stacks. The experimental results on the nematode DMI data show that the 3D X-Ray Transform based multilinear analysis method can effectively give 100% recognition rate on a real-life database.
Keywords :
biology computing; feature extraction; image classification; image texture; 3D x-ray transform; digital multifocal images; feature representation; multifocal images classification; multilinear feature extraction; multilinear x-ray transform; nematode taxonomy; tensor texture; Databases; Documentation; Feature extraction; Image analysis; Principal component analysis; Shape; Taxonomy; Tensile stress; Testing; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5540014
Filename :
5540014
Link To Document :
بازگشت