• DocumentCode
    3406055
  • Title

    Feasibility of conducting unit level EMI tests in a system level environment

  • Author

    Dixon, David ; Dutcher, Clinton

  • Author_Institution
    US Navel Underwater Syst. Center, New London, CT, USA
  • fYear
    1990
  • fDate
    21-23 Aug 1990
  • Firstpage
    353
  • Lastpage
    360
  • Abstract
    The advantages of conducting MIL-STD-462 type tests for US Naval systems while the equipment was configured in a system level type of environment have been discussed by D.S. Dixon (1989). The authors evaluate the possibility of using a thin (1 mil) metallic enclosure to permit RE-02 electric field measurements to be conducted, over the 10 kHz to 10 GHz frequency range, on the individual equipment enclosed within the electrically thin portable shield enclosure. Initial evaluation of the electromagnetic (EM) performance of a very portable, 1 mil thick aluminized plastic enclosure, which is kept one foot away from a 24"×24"×72" electronics cabinet, indicates that the enclosure would have excessive EM interaction with the unit-under-test (UUT) for frequencies at the low end of RE-02 frequency range. Therefore, to ensure that the UUT\´s radiated EM fields are not being perturbed, the enclosure must be made larger to increase the separation between the enclosure and the UUT or the concept will have to be reversed so that the portable enclosure shields one or more other units to determine the sources of a piece of equipment\´s high level emissions
  • Keywords
    electric field measurement; electromagnetic interference; electronic equipment testing; military systems; ships; 10 kHz to 10 GHz; HF; LF; MF; RE-02 electric field measurements; SHF; UHF; VHF; VLF; electrically thin portable shield enclosure; shipboard systems; system level environment; unit level EMI tests; Costs; Electric variables measurement; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Electronic equipment testing; Frequency measurement; Magnetic field measurement; Spectral analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1990.252788
  • Filename
    252788