Title :
Comparative analysis of GaAs/LDMOS/GaN high power transistors in a digital predistortion amplifier system
Author :
Vassilakis, Bill ; Cova, Armando
Author_Institution :
Corporate R&D, Powerwave Technol., Santa Ana, CA, USA
Abstract :
Silicon LDMOS transistors have long been employed as the technology of choice for high power amplifiers in cellular infrastructure equipment. With each successive generation, improvements have been achieved in the areas of power, efficiency, linearity and reliability. As device performance approaches ideal, the focus for improvements has shifted to circuit based techniques and alternate device technologies such as GaAs, and lately GaN. Employing these technologies successfully in high power amplifier designs affords unique opportunities and challenges. In addition, as distortion correction techniques migrate towards the digital domain, new algorithms must address the unique properties of each technology. In this paper a comparative analysis of GaAs, LDMOS, and GaN devices are performed in a digitally predistorted amplifier system.
Keywords :
III-V semiconductors; distortion; gallium arsenide; gallium compounds; microwave power amplifiers; power MOSFET; semiconductor device models; wide band gap semiconductors; GaAs; GaAs devices; GaAs high power transistors; GaN; GaN devices; GaN high power transistors; LDMOS devices; LDMOS high power transistors; cellular infrastructure equipment; digital predistortion amplifier system; distortion correction techniques; high power amplifiers; silicon LDMOS transistors; Circuits; Gallium arsenide; Gallium nitride; High power amplifiers; Linearity; Power generation; Power system reliability; Power transistors; Predistortion; Silicon; Gallium Arsenide; Gallium Nitride; MOS devices; amplifier; device modeling; digital predistortion; high power transmitters; microwave power FETs; microwave power amplifiers;
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
DOI :
10.1109/APMC.2005.1606487