Title :
Phenological stages-based NDVI in spring wheat yield estimation for the Canadian prairies
Author :
Kumar, V. ; Shaykewich, C.F. ; Haque, C.E.
Author_Institution :
Dept. of Geogr., Manitoba Univ., Winnipeg, Man., Canada
Abstract :
Spring wheat is a major export crop of the Canadian prairies (Alberta, Manitoba, Saskatchewan). Approximately 75 percent of its total production is exported through a grain marketing agency. In order to ensure optimum profits from the exports, pre-harvest wheat yield estimates are required as a component to the export marketing strategy and to drought planning. The more accurate the yield estimates, the better the strategy. Currently a regression model is employed, namely, the Western Canada Wheat Yield (WCWY) model to obtain the yield estimates. The model employs monthly weather data (average temperature and precipitation) and determines a drought index for most weather stations (about 120) across the prairies. The indices are then averaged and regressed against the average wheat yield for the prairies, to develop the WCWY model. The objective of this paper is to improve the performance of the WCWY model by utilizing daily, in place of monthly weather data and, further, by incorporating a Normalized Difference Vegetation Index (NDVI) based variable into the model
Keywords :
agriculture; geophysical techniques; meteorology; remote sensing; vegetation mapping; Alberta; Canada; Canadian prairies; Manitoba; NDVI; Normalized Difference Vegetation Index; Saskatchewan; WCWY model; Western Canada Wheat Yield; agriculture; crop yield; crops; drought index; export marketing strategy; geophysical measurement technique; meteorology; phenological stage; prediction model; regression model; remote sensing; spring wheat; vegetation mapping; yield estimate; Crops; Geography; Production; Soil; Springs; Statistical analysis; Strategic planning; Temperature distribution; Vegetation mapping; Yield estimation;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
Conference_Location :
Hamburg
Print_ISBN :
0-7803-5207-6
DOI :
10.1109/IGARSS.1999.775118