Title :
An automatic unsupervised classification of MR images in Alzheimer´s disease
Author :
Long, Xiaojing ; Wyatt, Chris
Author_Institution :
Virginia Tech, Blacksburg, VA, USA
Abstract :
Image-analysis methods play an important role in helping detect brain changes in and diagnosis of Alzheimer´s Disease (AD). In this paper, we propose an automatic unsupervised classification approach to distinguish brain magnetic resonance (MR) images of AD patients from those of elderly normal controls. The symmetric log-domain diffeomorphic demons algorithm, with the properties of symmetry and invertibility, is used to compute the pair-wise registration, whose deformation field is then used to calculate the Riemannian distance between them. The spectral embedding algorithm is performed based on the Riemannian distance matrix to project images onto a low-dimensional space where each image is represented as a point and its neighboring points correspond to images of high anatomical similarity. Finally, the quick shift clustering method is employed in the embedded space to partition the dataset into subgroups. The experiments using the proposed method show very good performance for clustering images into AD and normal aging, using the Clinical Dementia Rating (CDR) scale as a comparison.
Keywords :
biomedical MRI; diseases; image classification; medical image processing; Alzheimer disease diagnosis; CDR scale; Image analysis methods; MR images automatic unsupervised classification; Riemannian distance matrix; brain changes detection; brain magnetic resonance image; clinical dementia rating; deformation field; image clustering; log-domain diffeomorphic demons algorithm; pair-wise registration; quick shift clustering method; spectral embedding algorithm; Aging; Alzheimer´s disease; Automatic control; Clustering algorithms; Clustering methods; Dementia; Magnetic resonance; Partitioning algorithms; Senior citizens; Symmetric matrices;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6984-0
DOI :
10.1109/CVPR.2010.5540031