A novel low noise mixed signal switched CMOS readout chain for imaging-spectroscopic pixel X-ray detectors

Author

Kapnistis, C. ; Misiakos, K. ; Haralabidis, N.

Author_Institution

Inst. of Microelectron., NCSR Demokritos, Athens, Greece

Volume

1

fYear

1998

fDate

1998

Firstpage

417

Abstract

A novel CMOS charge sensitive readout chain with self switched output for pixel applications has been developed. The system is capable of simultaneous position sensing and energy measurement on a real time basis. Each pixel circuitry incorporates both analog and digital features to perform the dual task. The pixel electronics have been designed and fabricated in CMOS 0.8 μm technology. Noise evaluation of several charge amplifiers as input stages has been performed and reported. The overall gain of the chain is 620 mV/fC. With an ENC of 58 e^- RMS at 140 nsec shaping time and a power consumption of 1.8 mW per pixel at 3.3 V it is a promising solution for X-ray pixel detectors. The paper describes the system architecture and reports experimental measurements

Keywords

CMOS analogue integrated circuits; CMOS digital integrated circuits; X-ray detection; X-ray spectroscopy; digital readout; mixed analogue-digital integrated circuits; nuclear electronics; position sensitive particle detectors; pulse amplifiers; pulse shaping circuits; readout electronics; real-time systems; 1.8 mW; 3.3 V; analog features; charge amplifiers; charge sensitive readout chain; digital features; energy measurement; imaging-spectroscopic pixel X-ray detectors; low noise mixed signal switched CMOS readout chain; noise evaluation; overall gain; power consumption; real time basis; selfswitched output; shaping time; simultaneous position sensing; system architecture; CMOS image sensors; Capacitance; Energy measurement; Optical imaging; Pixel; Semiconductor device measurement; Spectroscopy; Switches; X-ray detectors; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE

Conference_Location

Toronto, Ont.

ISSN

1082-3654

Print_ISBN

0-7803-5021-9

Type

conf

DOI

10.1109/NSSMIC.1998.775174

Filename

775174