DocumentCode
3406767
Title
Free carrier absorption in red VCSELs
Author
Pinches, S.M. ; Onischenko, A. ; Sale, T.E. ; Woodhead, J.
Author_Institution
Dept. of Electron. & Electr. Eng., Sheffield Univ., UK
Volume
2
fYear
1999
fDate
1999
Firstpage
794
Abstract
Slope efficiency and threshold current density data as a function of wavelength for ~665 nm AlGaInP MQW DBR VCSELs are presented. This data indicates that free carrier absorption an important loss mechanism in red VCSELs
Keywords
III-V semiconductors; aluminium compounds; distributed Bragg reflector lasers; gallium compounds; indium compounds; infrared sources; laser transitions; light absorption; optical losses; quantum well lasers; surface emitting lasers; 665 nm; AlGaInP; AlGaInP MQW DBR VCSELs; free carrier absorption; loss mechanism; red VCSELs; slope efficiency; threshold current density data; Absorption; Mirrors; Optical losses; Optical scattering; Pulse measurements; Resonance; Substrates; Temperature; Threshold current; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-5634-9
Type
conf
DOI
10.1109/LEOS.1999.811973
Filename
811973
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