Title :
Boolean algebraic test generation using a distributed system
Author :
Bhattacharya, D. ; Agrawal, P.
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Abstract :
This paper describes an ROBDD-based distributed test generation algorithm for combinational circuits. This technique lends itself to a natural partitioning of both the fault list and the circuit across processors. A preliminary implementation on an Ethernet-connected SPARC2 workstation cluster shows the feasibility of the method.
Keywords :
combinational circuits; Boolean algebraic test generation; Ethernet-connected SPARC2 workstation cluster; ROBDD-based distributed test generation algorithm; circuit across processors; combinational circuits; distributed system; fault list; natural partitioning; Boolean functions; Circuit faults; Circuit testing; Clustering algorithms; Combinational circuits; Data structures; Partitioning algorithms; Sequential analysis; System testing; Tsunami;
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
DOI :
10.1109/ICCAD.1993.580094
