DocumentCode :
3406809
Title :
Ultra low power high efficiency charge pump design using NEM relays
Author :
Venkatasubramanian, Ramakrishnan ; Manohar, Sujan K. ; Balsara, Poras T.
Author_Institution :
VLSI Circuits & Syst. Lab., Univ. of Texas at Dallas, Richardson, TX, USA
fYear :
2011
fDate :
7-10 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
The zero leakage operation of Nano-electromechanical (NEM) relays make the device a promising candidate among emerging devices. Numerous end applications of NEM relay logic circuits have been proposed recently. This work explores the usage of NEM relays in on-chip power management circuits. Ron of the NEM relay switch is constant and is insensitive to the gate slew rate. This creates a paradigm shift in design of power switches. This coupled with infinite Roff offers significant area and power advantages over CMOS. Accurate Verilog-A models were developed based on published fabrication results of NEM relays operating at 1V with a nominal air gap of 5 - 10nm. As a feasibility study of using NEMS in integrated power electronics, a step-down charge pump with specifications suitable for audio power amplifier applications has been implemented and the results are compared against a standard commercial 65nm CMOS implementation. This work shows that NEM relay based charge pump has an area savings of 73X, power savings of 14X over CMOS and achieves 96:1% efficiency at max load condition (18mA).
Keywords :
CMOS integrated circuits; charge pump circuits; integrated circuit design; low-power electronics; nanoelectromechanical devices; relays; NEM relay switch; Verilog-A models; audio power amplifier; current 18 mA; efficiency 96.1 percent; gate slew rate; nanoelectromechanical relays; on-chip power management circuits; power switches; size 65 nm; ultra low power high efficiency charge pump design; zero leakage operation; Design automation; Metals; Nanoelectromechanical systems; Relays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
ISSN :
1548-3746
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2011.6026545
Filename :
6026545
Link To Document :
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