DocumentCode :
34069
Title :
Relation of Refractive Index to Ti-Concentration in Near-Stoichiometric 
Waveguide
Author :
De-Long Zhang ; Fang Han ; Shi-Yu Xu ; Bei Chen ; Ping-Rang Hua ; Dao-Yin Yu ; Pun Yue-Bun, Edwin
Author_Institution :
Sch. of Precision Instrum. & Opto-Electron. Eng., Tianjin Univ., Tianjin, China
Volume :
25
Issue :
17
fYear :
2013
fDate :
Sept.1, 2013
Firstpage :
1653
Lastpage :
1655
Abstract :
Multi-mode near-stoichiometric (NS) Ti:LiNbO3 planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO3 substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate.
Keywords :
diffusion; lithium compounds; metallic thin films; optical fabrication; optical planar waveguides; refractive index; secondary ion mass spectra; stoichiometry; titanium; Li-rich vapor transport equilibration; LiNbO3; LiNbO3:Ti; NS substrate; Ti-concentration profile; Ti-film in-diffusion; exponential relationship; extraordinary ray; initially congruent substrate; mode indices; multimode near-stoichiometric planar waveguide; ordinary ray; power index; refractive index profile; secondary ion mass spectrometry; Indexes; Lithium niobate; Optical waveguides; Planar waveguides; Refractive index; Substrates; Near-stoichiometric ${rm Ti{:}LiNbO}_{3}$
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2272719
Filename :
6557486
Link To Document :
