DocumentCode :
340693
Title :
LGSO scintillation crystals coupled to new large area APDs compared to LSO and BGO
Author :
Pichler, B.J. ; Böning, G. ; Rafecas, M. ; Schlosshauer, M. ; Lorenz, E. ; Ziegler, S.I.
Author_Institution :
Nuklearmedizinische Klinik und Poliklinik, Tech. Univ. Munchen, Germany
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
543
Abstract :
Recent developments of large area avalanche photodiodes (APDs) and fast scintillators with high light yield offer unique advantages for imaging applications. To test possible scintillator-APD combinations, 3.7×3.7×12.0 mm3 LGSO, EGO and LSO crystals were coupled to large area, low capacitance, round and rectangular APDs (5 mm diameter, 3×3 mm2 and 5×5 mm2, Hamamatsu, Japan). Light output, energy resolution and time resolution were compared. The light output of EGO was about 86% worse, of LGSO about 30% worse compared to LSO (100%). The energy resolution at 511 keV was 13.8±0.5% for LSO and 15.1±0.5% for LGSO (FWHM). With EGO 16.9±0.5% (FWHM) was measured at 662 keV. The coincident time resolution of two opposing single detectors was 2.7±0.2 ns for LSO and 3.9±0.2 ns for LGSO (FWHM). The chemical treatment of crystals showed an improved energy resolution compared to mechanically polishing of more than 1%, providing reduced cost and less processing time. An energy resolution of 10.7±0.5% for LSO could be reached after chemical etching. With the new large area APDs, results similar to PMT readout could be achieved. The scintillation characteristic of LGSO makes this material a promising candidate for APD readout, although the performance was inferior to LSO
Keywords :
avalanche photodiodes; gadolinium compounds; lutetium compounds; solid scintillation detectors; EGO; LGSO scintillation crystals; LSO; LuGdSiO5:Ce; chemical etching; coincident time resolution; energy resolution; fast scintillators; large area avalanche photodiodes; light output; time resolution; Avalanche photodiodes; Capacitance; Cerium; Chemical processes; Costs; Detectors; Energy resolution; Etching; Photonic crystals; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1082-3654
Print_ISBN :
0-7803-5021-9
Type :
conf
DOI :
10.1109/NSSMIC.1998.775199
Filename :
775199
Link To Document :
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