Title :
The w-value and the Fano factor for X-rays in xenon-neon gas mixtures: a Monte Carlo simulation study
Author :
Santos, F.P. ; Dias, T.H.V.T. ; Rachinhas, P.J.B.M. ; Conde, C.A.N. ; Stauffer, A.D.
Author_Institution :
Dept. de Fisica, Coimbra Univ., Portugal
Abstract :
The w-value and Fano factor F for the absorption of X-rays in Xe-Ne gas mixtures are investigated using a Monte Carlo simulation study. The w-value is the mean energy required to produce a primary electron in the gas, and the Fano factor is the relative variance of the number of primary electrons produced per incident X-ray photon. F and w are two fundamental characteristics of a detection medium, since the product Fw establishes the intrinsic energy resolution that can be achieved. Xenon is a preferred filling for gas detectors, but the energy resolution is known to deteriorate for low energy X-rays, due to electron loss to the entrance window. Since the addition of a lighter noble gas increases the absorption depth, Xe-Ne mixtures have been investigated as a potential medium for the detection of low energy X-rays. Monte Carlo simulation results for F and w are presented for X-ray energies up to 5 keV in pure xenon, pure neon and in Xe-Ne mixtures with 90%, 70%, 50%, 40%, 30%, 20%, 10%, 5% and 1% Xe, at a total pressure of 1 atmosphere. The simulation reproduces the photoionization process of both species, the vacancy cascade decay of the residual ions, and the elastic and inelastic scattering of electrons by the gas atoms. Energy and charge transfer mechanisms such as the Penning effect and transfer- and associative-ionization are taken into account
Keywords :
Monte Carlo methods; Penning ionisation; X-ray absorption; X-ray detection; associative ionisation; energy loss of particles; gas mixtures; ionisation chambers; neon; photoionisation; xenon; 0 to 5 keV; Fano factor; Monte Carlo simulation; Penning effect; X-ray absorption; Xe-Ne; associative-ionization; electron loss; gas mixtures; intrinsic energy resolution; photoionization; primary electron; residual ions; transfer-ionization; vacancy cascade decay; w-value; Atmosphere; Atmospheric modeling; Electromagnetic wave absorption; Electrons; Energy resolution; Filling; Gas detectors; X-ray detection; X-ray detectors; Xenon;
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5021-9
DOI :
10.1109/NSSMIC.1998.775206