Title :
GEM: performance and aging tests
Author :
Cho, H.S. ; Kadyk, J. ; Han, S.H. ; Hong, W.S. ; Perez-Mendez, V. ; Wenzel, W. ; Pitts, K. ; Martin, M.D. ; Hutchins, J.B.
Author_Institution :
Div. of Phys., Lawrence Berkeley Lab., CA, USA
Abstract :
Performance and aging tests have been done to characterize gas electron multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities
Keywords :
ageing; electron multiplier detectors; position sensitive particle detectors; proportional counters; GEM aging tests; GEM performance; absolute GEM gain; avalanche electrons trapping; closed GEM; field simulations; gas avalanche microdetectors; gas electron multipliers; long-term gain stabilities; short-term gain stabilities; Aging; Chemical lasers; Electrodes; Electrons; Geometry; Laboratories; Optical microscopy; Performance gain; Stability; Testing;
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5021-9
DOI :
10.1109/NSSMIC.1998.775210
