GEM: performance and aging tests

Author

Cho, H.S. ; Kadyk, J. ; Han, S.H. ; Hong, W.S. ; Perez-Mendez, V. ; Wenzel, W. ; Pitts, K. ; Martin, M.D. ; Hutchins, J.B.

Author_Institution

Div. of Phys., Lawrence Berkeley Lab., CA, USA

Volume

1

fYear

1998

fDate

1998

Firstpage

589

Abstract

Performance and aging tests have been done to characterize gas electron multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities

Keywords

ageing; electron multiplier detectors; position sensitive particle detectors; proportional counters; GEM aging tests; GEM performance; absolute GEM gain; avalanche electrons trapping; closed GEM; field simulations; gas avalanche microdetectors; gas electron multipliers; long-term gain stabilities; short-term gain stabilities; Aging; Chemical lasers; Electrodes; Electrons; Geometry; Laboratories; Optical microscopy; Performance gain; Stability; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE

Conference_Location

Toronto, Ont.

ISSN

1082-3654

Print_ISBN

0-7803-5021-9

Type

conf

DOI

10.1109/NSSMIC.1998.775210

Filename

775210