DocumentCode :
3407044
Title :
Bundled cable parameters and their impact on EMI measurement repeatability
Author :
Hubing, Todd H.
Author_Institution :
Missouri Univ., Rolla, MO, USA
fYear :
1990
fDate :
21-23 Aug 1990
Firstpage :
576
Lastpage :
580
Abstract :
EMI (electromagnetic interference) test procedures specify that long cables should be bundled at their center in some circumstances. The author investigates the effect of cable bundling using analytical models and measurements. He examines how cable bundle parameters such as length and `tightness´ can affect the repeatability of the measurement. Simple models of a bundled cable suggest that relatively small changes in the geometry of the bundle can significantly affect the common-mode cable current. Parameters such as length, tightness, location and the number of turns determine the impedance of the bundle. As the impedance of the cable bundle changes, the resonant frequency of the system shifts. This can result in large changes at the very frequencies where EMI problems are most likely to occur. It is also shown that lossy cables or cables with a lossy common-mode termination are less likely to be sensitive to minor changes in cable bundle parameters. The resonant peaks in a lossy system are smaller and cover a wider band of frequencies. Small shifts in the resonant frequency do not have as much of an impact on the currents induced at any one frequency
Keywords :
cables (electric); electromagnetic interference; transmission line theory; EMI measurement repeatability; EMI test procedures; analytical models; cable bundle parameters; cable bundling; common-mode cable current; electromagnetic interference; geometry; impedance; induced currents; length; location; lossy cables; lossy common-mode termination; lossy system; number of turns; resonant frequency; tightness; transmission line theory; Analytical models; Cables; Electromagnetic interference; Electromagnetic measurements; Geometry; Impedance; Length measurement; Resonant frequency; Solid modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.1990.252835
Filename :
252835
Link To Document :
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