Transfer impedance testing of multi-conductor shielded connectors of arbitrary cross-section

A novel transfer impedance test for shielded connectors is explored and documented which can be used effectively on multiconductor connectors of arbitrary cross-section such as the `D´ subminiature line of connectors. For connectors of average size the results are believable from DC up to 500 MHz. Of critical importance in the performance of shielded connectors is the quality of the cable shield to connector back shell termination. This test and fixturing method is designed to include this termination and allows environmental exposure without disturbing the interface. Results are displayed in real time with a fast sweep speed which facilitates evaluation and observation of shield performance under dynamic conditions. A variety of instruments may be used, but a vector network analyzer is recommended. It is concluded that the proposed method has many of the virtues necessary for consideration as a standard industry test methodology for transfer impedance of shielded connectors