DocumentCode :
3407130
Title :
Electrical properties of lead-free thick film NTC thermistors based on BaFe0.9Sn0.1O3 ceramic
Author :
Yuan, C.L. ; Liu, X.Y. ; Yang, Y. ; Xu, J.W. ; Zhou, C.R.
Author_Institution :
Sch. of Mater. Sci. & Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2010
fDate :
22-24 Oct. 2010
Firstpage :
445
Lastpage :
448
Abstract :
Lead free thick film NTC (negative temperature coefficient) thermistors based on perovskite-type semiconducting materials of different compositions BaFe0.9Sn0.1O3 + BaBiO3, and BaFe0.9Sn0.1O3 + BaBiO3 + CuO were fabricated on alumina substrate by screen printing technology. The evolution of microstructure, electrical performance of these resistors and the influence of thickness of thermistor layer on the thermistor constant and initial resistivity were studied. The thick film samples adhere very well to alumina substrate and show homogeneous microstructure. The electrical resistivity at 22 °C (ρ22), thermistor constant (B25/85), and activation energy (Ea) of the NTC thermistors decreases with increasing CuO content. At the almost same thickness, the values of ρ22, B25/85, and Ea of the thick film NTC thermistors are 3.197-19.25 kΩ·cm, 3318-4322 K, 0.289-0.376 eV, respectively. As thickness of the films increases, the thermistor constant and the initial resistivity of the thick film NTC thermistors decrease.
Keywords :
barium compounds; ceramics; electrical resistivity; semiconductor materials; semiconductor thin films; thermistors; BaBiO3; BaFe0.9Sn0.1O3; CuO; activation energy; alumina substrate; ceramic; electrical performance; electrical property; electrical resistivity; homogeneous microstructure; lead-free thick film NTC thermistor; negative temperature coefficient; perovskite-type semiconducting material; screen printing technology; temperature 22 C; thermistor constant; BaFe0.9Sn0.1O3; Lead free; Thick film NTC thermistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Computing and Integrated Systems (ICISS), 2010 International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-6834-8
Type :
conf
DOI :
10.1109/ICISS.2010.5656064
Filename :
5656064
Link To Document :
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