DocumentCode
3407130
Title
Electrical properties of lead-free thick film NTC thermistors based on BaFe0.9 Sn0.1 O3 ceramic
Author
Yuan, C.L. ; Liu, X.Y. ; Yang, Y. ; Xu, J.W. ; Zhou, C.R.
Author_Institution
Sch. of Mater. Sci. & Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear
2010
fDate
22-24 Oct. 2010
Firstpage
445
Lastpage
448
Abstract
Lead free thick film NTC (negative temperature coefficient) thermistors based on perovskite-type semiconducting materials of different compositions BaFe0.9Sn0.1O3 + BaBiO3, and BaFe0.9Sn0.1O3 + BaBiO3 + CuO were fabricated on alumina substrate by screen printing technology. The evolution of microstructure, electrical performance of these resistors and the influence of thickness of thermistor layer on the thermistor constant and initial resistivity were studied. The thick film samples adhere very well to alumina substrate and show homogeneous microstructure. The electrical resistivity at 22 °C (ρ22), thermistor constant (B25/85), and activation energy (Ea) of the NTC thermistors decreases with increasing CuO content. At the almost same thickness, the values of ρ22, B25/85, and Ea of the thick film NTC thermistors are 3.197-19.25 kΩ·cm, 3318-4322 K, 0.289-0.376 eV, respectively. As thickness of the films increases, the thermistor constant and the initial resistivity of the thick film NTC thermistors decrease.
Keywords
barium compounds; ceramics; electrical resistivity; semiconductor materials; semiconductor thin films; thermistors; BaBiO3; BaFe0.9Sn0.1O3; CuO; activation energy; alumina substrate; ceramic; electrical performance; electrical property; electrical resistivity; homogeneous microstructure; lead-free thick film NTC thermistor; negative temperature coefficient; perovskite-type semiconducting material; screen printing technology; temperature 22 C; thermistor constant; BaFe0.9 Sn0.1 O3 ; Lead free; Thick film NTC thermistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Computing and Integrated Systems (ICISS), 2010 International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-6834-8
Type
conf
DOI
10.1109/ICISS.2010.5656064
Filename
5656064
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