DocumentCode
3407192
Title
Cellular Automata Synthesis Based On Precomputed Test Vectors For Built-in Self-test
Author
Boubezari, S. ; Kaminska, B.
Author_Institution
Electrical Engineering Department Ecole Polytechnique De Montkal, Qc, Canada
fYear
1993
fDate
7-11 Nov. 1993
Firstpage
578
Lastpage
583
Abstract
A new deterministic BIST approach to generate a set of test vectors is proposed. Given a set ofpre-computed test vectors (obtained by an ATPG tool) with a predetermined fault coverage, a simple test vector generator (TVG) based on a cellular automata (CA) structures is synthesized to generate the given test set.
Keywords
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Counting circuits; Delay; Hardware; Linear feedback shift registers; Read only memory; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-4490-7
Type
conf
DOI
10.1109/ICCAD.1993.580118
Filename
580118
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