Title :
Cellular Automata Synthesis Based On Precomputed Test Vectors For Built-in Self-test
Author :
Boubezari, S. ; Kaminska, B.
Author_Institution :
Electrical Engineering Department Ecole Polytechnique De Montkal, Qc, Canada
Abstract :
A new deterministic BIST approach to generate a set of test vectors is proposed. Given a set ofpre-computed test vectors (obtained by an ATPG tool) with a predetermined fault coverage, a simple test vector generator (TVG) based on a cellular automata (CA) structures is synthesized to generate the given test set.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Counting circuits; Delay; Hardware; Linear feedback shift registers; Read only memory; Vectors;
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
DOI :
10.1109/ICCAD.1993.580118
