DocumentCode
3407274
Title
Mining succinct and high-coverage API usage patterns from source code
Author
Jue Wang ; Yingnong Dang ; Hongyu Zhang ; Kai Chen ; Tao Xie ; Dongmei Zhang
Author_Institution
Tsinghua Univ., Beijing, China
fYear
2013
fDate
18-19 May 2013
Firstpage
319
Lastpage
328
Abstract
During software development, a developer often needs to discover specific usage patterns of Application Programming Interface (API) methods. However, these usage patterns are often not well documented. To help developers to get such usage patterns, there are approaches proposed to mine client code of the API methods. However, they lack metrics to measure the quality of the mined usage patterns, and the API usage patterns mined by the existing approaches tend to be many and redundant, posing significant barriers for being practical adoption. To address these issues, in this paper, we propose two quality metrics (succinctness and coverage) for mined usage patterns, and further propose a novel approach called Usage Pattern Miner (UP-Miner) that mines succinct and high-coverage usage patterns of API methods from source code. We have evaluated our approach on a large-scale Microsoft codebase. The results show that our approach is effective and outperforms an existing representative approach MAPO. The user studies conducted with Microsoft developers confirm the usefulness of the proposed approach in practice.
Keywords
application program interfaces; data mining; software reusability; MAPO; UP-miner; application programming interface; client code mining; high-coverage API usage pattern mining; large-scale Microsoft codebase; software development; software reuse; source code; succinct API usage pattern mining; usage pattern discovery; usage pattern miner; Clustering algorithms; Context; Data mining; Indexes; Measurement; Probabilistic logic; Redundancy; API usage; mining software repositories; sequence mining; software reuse; usage pattern;
fLanguage
English
Publisher
ieee
Conference_Titel
Mining Software Repositories (MSR), 2013 10th IEEE Working Conference on
Conference_Location
San Francisco, CA
ISSN
2160-1852
Print_ISBN
978-1-4799-0345-0
Type
conf
DOI
10.1109/MSR.2013.6624045
Filename
6624045
Link To Document