Title :
Nonparametric higher-order learning for interactive segmentation
Author :
Kim, Tae Hoon ; Lee, Kyoung Mu ; Lee, Sang Uk
Author_Institution :
Dept. of EECS, Seoul Nat. Univ., Seoul, South Korea
Abstract :
In this paper, we deal with a generative model for multilabel, interactive segmentation. To estimate the pixel likelihoods for each label, we propose a new higher-order formulation additionally imposing the soft label consistency constraint whereby the pixels in the regions, generated by unsupervised image segmentation algorithms, tend to have the same label. In contrast with previous works which focus on the parametric model of the higher-order cliques for adding this soft constraint, we address a nonparametric learning technique to recursively estimate the region likelihoods as higher-order cues from the resulting likelihoods of pixels included in the regions. Therefore the main idea of our algorithm is to design two quadratic cost functions of pixel and region likelihoods, that are supplementary to each other, in a proposed multi-layer graph and to estimate them simultaneously by a simple optimization technique. In this manner, we consider long-range connections between the regions that facilitate propagation of local grouping cues across larger image areas. The experiments on challenging data sets show that integration of higher-order cues quantitatively and qualitatively improves the segmentation results with detailed boundaries and reduces sensitivity with respect to seed quantity and placement.
Keywords :
graph theory; image segmentation; maximum likelihood estimation; unsupervised learning; higher-order cues; interactive segmentation; multilayer graph; nonparametric higher-order learning; pixel likelihood estimation; quadratic cost functions; seed placement; seed quantity; soft constraint; unsupervised image segmentation; Algorithm design and analysis; Cost function; Design optimization; Image generation; Image segmentation; Labeling; Parametric statistics; Pixel; Recursive estimation; Robustness;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6984-0
DOI :
10.1109/CVPR.2010.5540078