• DocumentCode
    3407413
  • Title

    Novel characterization technique by using an SEM

  • Author

    Sutjipto, A. G E ; Jufriadi ; Muhida, R. ; Takata, M.

  • Author_Institution
    Dept. of Manuf. & Mater. Eng., Int. Islamic Univ. Malaysia, Kuala Lumpur
  • Volume
    2
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    603
  • Lastpage
    606
  • Abstract
    Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.
  • Keywords
    electron beam effects; flashover; insulating materials; magnesium compounds; scanning electron microscopy; surface charging; MgO; SEM; electric field distribution; electron bombardment; energetic electron beam; insulation property; insulator; metallic coating; scanning electron microscope; surface breakdown; surface discharging; surface flashover; Aircraft manufacture; Coatings; Electron beams; Insulation; Metal-insulator structures; Plasma displays; Scanning electron microscopy; Surface charging; Surface discharges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2008. ISDEIV 2008. 23rd International Symposium on
  • Conference_Location
    Bucharest
  • ISSN
    1093-2941
  • Print_ISBN
    978-973-755-382-9
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2008.4676866
  • Filename
    4676866