DocumentCode :
3407413
Title :
Novel characterization technique by using an SEM
Author :
Sutjipto, A. G E ; Jufriadi ; Muhida, R. ; Takata, M.
Author_Institution :
Dept. of Manuf. & Mater. Eng., Int. Islamic Univ. Malaysia, Kuala Lumpur
Volume :
2
fYear :
2008
fDate :
15-19 Sept. 2008
Firstpage :
603
Lastpage :
606
Abstract :
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.
Keywords :
electron beam effects; flashover; insulating materials; magnesium compounds; scanning electron microscopy; surface charging; MgO; SEM; electric field distribution; electron bombardment; energetic electron beam; insulation property; insulator; metallic coating; scanning electron microscope; surface breakdown; surface discharging; surface flashover; Aircraft manufacture; Coatings; Electron beams; Insulation; Metal-insulator structures; Plasma displays; Scanning electron microscopy; Surface charging; Surface discharges; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2008. ISDEIV 2008. 23rd International Symposium on
Conference_Location :
Bucharest
ISSN :
1093-2941
Print_ISBN :
978-973-755-382-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2008.4676866
Filename :
4676866
Link To Document :
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