DocumentCode
3407413
Title
Novel characterization technique by using an SEM
Author
Sutjipto, A. G E ; Jufriadi ; Muhida, R. ; Takata, M.
Author_Institution
Dept. of Manuf. & Mater. Eng., Int. Islamic Univ. Malaysia, Kuala Lumpur
Volume
2
fYear
2008
fDate
15-19 Sept. 2008
Firstpage
603
Lastpage
606
Abstract
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.
Keywords
electron beam effects; flashover; insulating materials; magnesium compounds; scanning electron microscopy; surface charging; MgO; SEM; electric field distribution; electron bombardment; energetic electron beam; insulation property; insulator; metallic coating; scanning electron microscope; surface breakdown; surface discharging; surface flashover; Aircraft manufacture; Coatings; Electron beams; Insulation; Metal-insulator structures; Plasma displays; Scanning electron microscopy; Surface charging; Surface discharges; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 2008. ISDEIV 2008. 23rd International Symposium on
Conference_Location
Bucharest
ISSN
1093-2941
Print_ISBN
978-973-755-382-9
Electronic_ISBN
1093-2941
Type
conf
DOI
10.1109/DEIV.2008.4676866
Filename
4676866
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