Title :
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards
Author :
Marzouki, M. ; Lubaszewski, M. ; Touati, M.H.
Author_Institution :
INPG/TIMA, Grenoble, France
Abstract :
A methodology is presented that unifies the fault detection and fault diagnosis of boundary scan (BS) interconnects and logic clusters in partial boundary scan boards. The software implementing this methodology and some experimental results are also described.
Keywords :
boundary scan testing; BS interconnects; boundary scan; fault detection; fault diagnosis; logic clusters; partial boundary scan boards; software; Circuit faults; Circuit testing; Fault detection; Fault diagnosis; Integrated circuit interconnections; Knowledge based systems; Logic testing; Observability; System testing; Wiring;
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
DOI :
10.1109/ICCAD.1993.580156
