• DocumentCode
    3407691
  • Title

    Blind optimization of algorithm parameters for signal denoising by Monte-Carlo SURE

  • Author

    Ramani, Sathish ; Blu, Thierry ; Unser, Michael

  • Author_Institution
    Biomed. Imaging Group, Ecole Polytech. Fed. de Lausanne, Lausanne
  • fYear
    2008
  • fDate
    March 31 2008-April 4 2008
  • Firstpage
    905
  • Lastpage
    908
  • Abstract
    We consider the problem of optimizing the parameters of an arbitrary denoising algorithm by minimizing Stein´s unbiased risk estimate (SURE) which provides a means of assessing the true mean-squared-error (MSE) purely from the measured data assuming that it is corrupted by Gaussian noise. To accomplish this, we propose a novel Monte-Carlo technique based on a black-box approach which enables the user to compute SURE for an arbitrary denoising algorithm with some specific parameter setting. Our method only requires the response of the denoising algorithm to additional input noise and does not ask for any information about the functional form of the corresponding denoising operator. This, therefore, permits SURE-based optimization of a wide variety of denoising algorithms (global-iterative, pointwise, etc). We present experimental results to justify our claims.
  • Keywords
    Gaussian processes; Monte Carlo methods; mean square error methods; optimisation; signal denoising; Gaussian noise; Monte-Carlo SURE; Stein unbiased risk estimation; algorithm parameters; arbitrary denoising algorithm; black-box approach; blind optimization; mean-squared-error; signal denoising; Bayesian methods; Biomedical imaging; Biomedical measurements; Gaussian noise; Noise measurement; Noise reduction; Signal analysis; Signal denoising; Signal mapping; Yield estimation; Monte-Carlo estimation; Stein’s unbiased risk estimate; Total variation denoising; wavelet soft-thresholding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-1483-3
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2008.4517757
  • Filename
    4517757