Title :
A low-power high-linearity symmetrical readout circuit for capacitive sensors
Author :
Kaimin Zhou ; Ziqiang Wang ; Fule Li ; Chun Zhang ; Zhihua Wang
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
This paper presents a symmetrical readout circuit for capacitive sensors. Based on charge transfer principle, it is insensitive to stray capacitors. Introducing a reference branch, this symmetrical readout circuit can enlarge its linear range, reduce amplifier offsets and reject common-mode noise and even-order distortions. Chopper stabilization technique is used to reduce the negative effects of the amplifier offset and flicker (1/f) noise. A Verilog-A based varactor is used to model the real variable sensing capacitor. Simulation results are given for sensing capacitor changing frequency at 1 KHz. Metal-Insulator-Metal (MIM) capacitor array is designed on chip for measurement. Measurement results show that this circuit can achieve sensitivity of 370 mV/pF, linearity error below 1 % and power consumption as low as 2.5 mW. This symmetrical readout circuit can respond to FPGA controlled sensing capacitor array changed every 1 ms.
Keywords :
1/f noise; MIM devices; capacitive sensors; choppers (circuits); field programmable gate arrays; flicker noise; hardware description languages; low-power electronics; operational amplifiers; readout electronics; sensor arrays; varactors; 1/f noise; FPGA controlled sensing capacitor array; MIM capacitor array; Verilog-A based varactor; amplifier offset reduction; charge transfer principle; chopper stabilization technique; common-mode noise rejection; even-order distortion; flicker noise; frequency 1 kHz; linearity error; low-power high-linearity symmetrical readout circuit; metal-insulator-metal capacitor array; power consumption; stray capacitor; time 1 ms; Calibration; Capacitance; Micromechanical devices; Semiconductor device measurement; Sensitivity; System-on-a-chip;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026615