• DocumentCode
    3408213
  • Title

    Comparing effects of SVC and STATCOM on distance relay tripping characteristic

  • Author

    Jamali, S. ; Kazemi, A. ; Shateri, H.

  • Author_Institution
    Center of Excellence for Power Syst. Autom. & Oper., Iran Univ. of Sci. & Technol., Tehran
  • fYear
    2008
  • fDate
    June 30 2008-July 2 2008
  • Firstpage
    1568
  • Lastpage
    1573
  • Abstract
    This paper presents and compares the measured impedance at the relaying point in the presence of shunt connected flexible alternating current transmission system (FACTS) devices, i.e. static VAr compensator (SVC) and static synchronous compensator (STATCOM). The presence of the shunt connected FACTS devices on a transmission line greatly affects the measured impedance at the relaying point. The measured impedance itself depends on the power system structural conditions, pre-fault loading, and especially the ground fault resistance. In the presence of shunt connected FACTS devices, their structural and controlling parameters as well as their installation position, affects the measured impedance. Here, the measured impedance at the relaying point is calculated due to the mentioned affecting parameters, and compared in the two cases of SVC and STATCOM.
  • Keywords
    flexible AC transmission systems; power transmission protection; relay protection; static VAr compensators; STATCOM; SVC; distance protection operation; distance relay tripping characteristic; ground fault resistance; shunt connected flexible alternating current transmission system; static VAr compensator; static synchronous compensator; Automatic voltage control; Current measurement; Electrical resistance measurement; Flexible AC transmission systems; Impedance measurement; Power system relaying; Protective relaying; Relays; Static VAr compensators; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-1665-3
  • Electronic_ISBN
    978-1-4244-1666-0
  • Type

    conf

  • DOI
    10.1109/ISIE.2008.4676914
  • Filename
    4676914