DocumentCode :
3408214
Title :
Process and equipment considerations in the implantation of GaAs
Author :
Dykstra, Jerald P. ; Arrale, Abdikarim M. ; Schneider, Mark R.
Author_Institution :
Semicond. Equip. Div., Eaton Corp., Beverly, MA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
71
Abstract :
Ion implantation of GaAs presents process requirements differing from standard silicon processing. Different implant species having differing source requirements are commonly used. GaAs devices may be susceptible to different contaminants, including some which are common construction materials in implanters intended for silicon implant applications. Because of its physical characteristics, GaAs poses different handling challenges. In some situations, implantation of GaAs at elevated temperatures is preferred. We examine some of these differences between silicon and GaAs processing and describe standard features and optional adaptations of a medium current ion implanter that facilitates processing of GaAs. These include source adaptations, wafer clamping and sensing adaptations, and a capability to implant at elevated substrate temperatures
Keywords :
III-V semiconductors; gallium arsenide; ion implantation; semiconductor doping; GaAs; contaminants; ion implantation; medium current ion implanter; sensing adaptations; source adaptations; substrate temperature; wafer clamping; Building materials; Costs; Electronics industry; Gallium arsenide; Implants; Ion implantation; Production; Semiconductor materials; Silicon; Springs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4538-X
Type :
conf
DOI :
10.1109/IIT.1999.812054
Filename :
812054
Link To Document :
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