Title :
Multi-loops control design for a new Sheppard-Taylor based Power Factor Corrector with model-nonlinearity compensation
Author :
Kanaan, Hadi Y. ; Hayek, Alfred ; Al-Haddad, Kamal
Author_Institution :
Dept. of Electr. & Mech. Eng., St.-Joseph Univ., Mkalles
fDate :
June 30 2008-July 2 2008
Abstract :
In this paper, a new nonlinearity compensation control is developed and applied for a single-phase Power Factor Corrector (PFC) based on the combination of the Sheppard-Taylor and SEPIC topologies. Compared to conventional buck, boost or buck-boost PFCs, this topology allows a better current tracking at the AC side, with a relatively reduced voltage at the DC side. Based on the exact linearization of the converterpsilas averaged model, and on the use of a fixed-frequency carrier to generate the Pulse-Width-Modulated (PWM) gate signal, the control system is designed to ensure unity power factor at the rectifier AC-side and regulated voltage at the rectifier DC-side. The performance of the proposed control scheme is tested through simulations, and evaluated in terms of source current Total Harmonic Distortion (THD), input power factor and DC-voltage regulation.
Keywords :
DC-DC power convertors; control nonlinearities; harmonic distortion; nonlinear control systems; power factor correction; rectifying circuits; voltage control; DC-voltage regulation; fixed-frequency carrier; model-nonlinearity compensation; multiloops control design; nonlinearity compensation control; pulse-width-modulated gate signal; single-phase power factor corrector; source current total harmonic distortion; unity power factor; Control design; Power generation; Power system modeling; Pulse generation; Pulse width modulation converters; Reactive power; Rectifiers; Signal generators; Topology; Voltage; SEPIC converter; Sheppard-Taylor topology; Single-phase rectifiers; computer simulations; nonlinearity compensation control; power factor correction;
Conference_Titel :
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4244-1665-3
Electronic_ISBN :
978-1-4244-1666-0
DOI :
10.1109/ISIE.2008.4676935