DocumentCode
3408646
Title
An error control code scheme for multilevel Flash memories
Author
Gregori, Stefano ; Khouri, Osama ; Micheloni, Rino ; Torelli, Guido
Author_Institution
Dipt. di Elettronica, Pavia Univ., Italy
fYear
2001
fDate
2001
Firstpage
45
Lastpage
49
Abstract
Presents a new scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different "bit-layers", which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is therefore achieved by using a simple error control code (ECC) providing single-bit correction, regardless of the number of bits stored in a single cell. This greatly simplifies the encoding and decoding circuits and minimizes the impact of ECC time overhead on memory access time. Moreover the same encoding/decoding circuit and check cells are used with multilevel memories working at a variable number of bits per cell
Keywords
cellular arrays; decoding; error correction codes; flash memories; multivalued logic; ECC; bit-layers; check cells; decoding circuits; error control code scheme; memory access time; multilevel Flash memories; single memory cell; time overhead; variable bit number; Block codes; Circuits; Decoding; Encoding; Error correction; Error correction codes; Fabrication; Flash memory; Nonvolatile memory; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, IEEE International Workshop on, 2001.
Conference_Location
San Jose, CA
Print_ISBN
0-7695-1242-9
Type
conf
DOI
10.1109/MTDT.2001.945227
Filename
945227
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