• DocumentCode
    3408646
  • Title

    An error control code scheme for multilevel Flash memories

  • Author

    Gregori, Stefano ; Khouri, Osama ; Micheloni, Rino ; Torelli, Guido

  • Author_Institution
    Dipt. di Elettronica, Pavia Univ., Italy
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    45
  • Lastpage
    49
  • Abstract
    Presents a new scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different "bit-layers", which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is therefore achieved by using a simple error control code (ECC) providing single-bit correction, regardless of the number of bits stored in a single cell. This greatly simplifies the encoding and decoding circuits and minimizes the impact of ECC time overhead on memory access time. Moreover the same encoding/decoding circuit and check cells are used with multilevel memories working at a variable number of bits per cell
  • Keywords
    cellular arrays; decoding; error correction codes; flash memories; multivalued logic; ECC; bit-layers; check cells; decoding circuits; error control code scheme; memory access time; multilevel Flash memories; single memory cell; time overhead; variable bit number; Block codes; Circuits; Decoding; Encoding; Error correction; Error correction codes; Fabrication; Flash memory; Nonvolatile memory; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, IEEE International Workshop on, 2001.
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-1242-9
  • Type

    conf

  • DOI
    10.1109/MTDT.2001.945227
  • Filename
    945227