DocumentCode
3408650
Title
The beam line architecture of the VIISta 810 medium current ion implanter
Author
Renau, Anthony
Author_Institution
Varian Ion Implant Syst., Gloucester, MA, USA
Volume
1
fYear
1999
fDate
1999
Firstpage
162
Abstract
The VIISta 810 medium current ion implanter beam line has been designed to produce beam currents from 2 μA to 5 mA with energies from 2 keV to 810 keV. The beam is 200 mm or 300 mm wide on wafer, uniform to better than 0.5% (1σ RMS) and parallel to better than 0.7°. The system uses a novel beam line architecture to address the stringent limitations on particle, metal, energy and cross contamination for sub 180 nm line width device requirements. The beam line architecture and optics are presented and performance data reviewed
Keywords
ion implantation; ion optics; particle beam diagnostics; semiconductor device manufacture; semiconductor doping; 180 nm; 2 muA to 5 mA; 2 to 810 keV; 200 mm; 300 mm; VIISta 810 medium current ion implanter; beam line architecture; sub 180 nm line width device requirements; Acceleration; Contamination; Filters; Implants; Ion beams; Ion sources; Magnetic separation; Particle beams; Productivity; Valves;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location
Kyoto
Print_ISBN
0-7803-4538-X
Type
conf
DOI
10.1109/IIT.1999.812077
Filename
812077
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