• DocumentCode
    3408650
  • Title

    The beam line architecture of the VIISta 810 medium current ion implanter

  • Author

    Renau, Anthony

  • Author_Institution
    Varian Ion Implant Syst., Gloucester, MA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    162
  • Abstract
    The VIISta 810 medium current ion implanter beam line has been designed to produce beam currents from 2 μA to 5 mA with energies from 2 keV to 810 keV. The beam is 200 mm or 300 mm wide on wafer, uniform to better than 0.5% (1σ RMS) and parallel to better than 0.7°. The system uses a novel beam line architecture to address the stringent limitations on particle, metal, energy and cross contamination for sub 180 nm line width device requirements. The beam line architecture and optics are presented and performance data reviewed
  • Keywords
    ion implantation; ion optics; particle beam diagnostics; semiconductor device manufacture; semiconductor doping; 180 nm; 2 muA to 5 mA; 2 to 810 keV; 200 mm; 300 mm; VIISta 810 medium current ion implanter; beam line architecture; sub 180 nm line width device requirements; Acceleration; Contamination; Filters; Implants; Ion beams; Ion sources; Magnetic separation; Particle beams; Productivity; Valves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1999.812077
  • Filename
    812077