DocumentCode :
3408650
Title :
The beam line architecture of the VIISta 810 medium current ion implanter
Author :
Renau, Anthony
Author_Institution :
Varian Ion Implant Syst., Gloucester, MA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
162
Abstract :
The VIISta 810 medium current ion implanter beam line has been designed to produce beam currents from 2 μA to 5 mA with energies from 2 keV to 810 keV. The beam is 200 mm or 300 mm wide on wafer, uniform to better than 0.5% (1σ RMS) and parallel to better than 0.7°. The system uses a novel beam line architecture to address the stringent limitations on particle, metal, energy and cross contamination for sub 180 nm line width device requirements. The beam line architecture and optics are presented and performance data reviewed
Keywords :
ion implantation; ion optics; particle beam diagnostics; semiconductor device manufacture; semiconductor doping; 180 nm; 2 muA to 5 mA; 2 to 810 keV; 200 mm; 300 mm; VIISta 810 medium current ion implanter; beam line architecture; sub 180 nm line width device requirements; Acceleration; Contamination; Filters; Implants; Ion beams; Ion sources; Magnetic separation; Particle beams; Productivity; Valves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4538-X
Type :
conf
DOI :
10.1109/IIT.1999.812077
Filename :
812077
Link To Document :
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