DocumentCode
3408797
Title
Introducing the NV-GSD-HE3, a new high energy implanter
Author
Sugitani, Michiro ; Tsukihara, Mitsukuni ; Takei, Shusaku ; McIntryre, E. ; DeLuca, Don ; Parrill, Tom
Author_Institution
Sumitomo Eaton Nova Corp., Ehime, Japan
Volume
1
fYear
1999
fDate
1999
Firstpage
192
Abstract
A new high energy implanter, the NV-GSD-HE3, improving upon the design concepts of the industry-leading GSD/HE series, has been developed in order to meet new and future device process requirements. Besides processing 300-mm wafers, the HE3 produces higher ion energies than the GSD/HE in a package that incorporates higher efficiency linear accelerator technology. The system layout has also been optimized so that footprint is reduced compared to the GSD/VHE while maintaining the same twin well and triple well process capability. A new endstation capable of batch processing 300-mm wafers, at a mechanical throughput equal to or exceeding that for 200-mm wafers in the GSD/HE system, has been developed. An evolutionary beam line has been developed, including a new mass-analysis magnet, final energy magnet and resonators with increased voltage output and higher efficiency. The HE3 also incorporates the extended life source technology, designed to obtain high beam current and long source life for multiply charged ions
Keywords
VLSI; batch processing (industrial); integrated circuit manufacture; ion implantation; semiconductor doping; 300 mm; 300-mm wafers; NV-GSD-HE3; VLSI; batch processing; beam line; design concepts; device process requirements; endstation; extended life source technology; final energy magnet; high beam current; high energy implanter; linear accelerator technology; long source life; mass-analysis magnet; mechanical throughput; multiply charged ions; resonators; system layout; triple well process capability; twin well process capability; voltage output; Boron; Costs; Energy consumption; Helium; Manufacturing; Packaging; Production; Throughput; Toy industry; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location
Kyoto
Print_ISBN
0-7803-4538-X
Type
conf
DOI
10.1109/IIT.1999.812085
Filename
812085
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