DocumentCode :
3408808
Title :
Author index
fYear :
2001
fDate :
7-7 Aug. 2001
Firstpage :
105
Lastpage :
105
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design and Testing, IEEE International Workshop on, 2001.
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-1242-9
Type :
conf
DOI :
10.1109/MTDT.2001.945237
Filename :
945237
Link To Document :
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