• DocumentCode
    3408888
  • Title

    Enhanced low energy drift-mode beam currents in a high current ion implanter

  • Author

    Angel, Gordon ; Bell, Edward ; Brown, Douglas ; Buff, James ; Collins, Mark ; Cummings, James ; Radovanov, Svetlana ; White, Nicholas R.

  • Author_Institution
    Varian Ion Implant Syst., Gloucester, MA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    219
  • Abstract
    The VIISta 80 high current ion implanter uses one or two stages of deceleration to produce the requisite high beam currents at low energies. For implantation processes that have a zero tolerance for energy contamination the single stage of deceleration located before the final bending magnet provides an enhanced drift mode of operation in which the end station sees ions issuing from a virtual source located at the mass slit. The development of the deceleration system and some preliminary results are discussed
  • Keywords
    beam handling techniques; ion implantation; particle beam diagnostics; semiconductor device manufacture; semiconductor doping; VIISta 80 high current ion implanter; deceleration; energy contamination; enhanced low energy drift-mode beam currents; high beam currents; high current ion implanter; mass slit; virtual source; zero tolerance; Boron; Contamination; Electrostatics; Energy resolution; Implants; Magnetic analysis; Production; Semiconductor device manufacture; Space charge; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1999.812091
  • Filename
    812091