Title :
Possibilities to miss predicting timing errors in canary flip-flops
Author :
Kunitake, Y. ; Sato, Takao ; Yasuura, H. ; Hayashida, T.
Author_Institution :
Kyushu Univ., Fukuoka, Japan
Abstract :
Deep submicron technologies increase parameter variations, which will make microprocessor designs very difficult, since every variation requires a large safety margin for achieving specified timing yield. This means higher supply voltage, which results in large energy consumption. Razor flip-flop (FF) is a clever technique to eliminate the supply voltage margin by exploiting circuit-level timing speculation. It combines dynamic voltage scaling technique with the error detection and recovery mechanism. We are studying an alternative timing-error-predicting FF, named canary FF. This paper discusses a critical issue regarding the canary FF. Detailed gate- and architectural-level co-simulations unveil that canary FF occasionally misses predicting timing errors.
Keywords :
error detection; flip-flops; architectural-level cosimulation; canary flip-flops; circuit-level timing speculation; deep submicron technology; dynamic voltage scaling technique; energy consumption; error detection; microprocessor design; razor flip-flop; recovery mechanism; safety margin; supply voltage; timing error prediction; Delay; Irrigation; Logic gates; Robustness; DVS; Razor; low-power; microprocessors; variations;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026656