DocumentCode :
3409
Title :
Modeling and Analysis of Power Distribution Networks in 3-D ICs
Author :
Xiang Hu ; Peng Du ; Buckwalter, James F. ; Chung-kuan Cheng
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
Volume :
21
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
354
Lastpage :
366
Abstract :
This paper addresses the modeling and analysis problems for power distribution networks (PDNs) in 3-D ICs. An on-chip distributed model is proposed for 3-D power grids, in which the details of metal layers are considered. The distributed model is demonstrated to be essential to identifying the unique noise behavior of 3-D PDNs. A lumped model is proposed based on the distributed model. The lumped model features the connection impedance between tiers and is proven to be useful for designers to understand the global effects of 3-D PDNs. Based on the models, an analysis flow is designed for 3-D PDNs in both frequency domain and time domain. With the analysis flow, the electrical characteristics of 3-D PDNs are studied systematically for the first time. The frequency-domain analysis identifies the global and local resonance phenomena in 3-D PDNs that are distinct from those in 2-D PDNs. The physical mechanisms behind the resonance phenomena are investigated. The time-domain analysis predicts the worst-case supply noise based on distributed current constraints. The “Rogue Wave” concept is introduced to explain the spatial and temporal relations of the worst-case on-chip noise responses in 3-D PDNs.
Keywords :
distribution networks; frequency-domain analysis; lumped parameter networks; three-dimensional integrated circuits; time-domain analysis; 3D IC; 3D power distribution networks; 3D power grids; Rogue Wave concept; connection impedance; distributed current constraints; electrical characteristics; frequency-domain analysis; global resonance phenomena; local resonance phenomena; lumped model; metal layers; on-chip distributed model; time-domain analysis; unique noise behavior; worst-case on-chip noise responses; worst-case supply noise; Analytical models; Integrated circuit modeling; Metals; Noise; Power grids; Solid modeling; System-on-a-chip; 3-D IC; modeling and analysis; power distribution network;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2012.2183904
Filename :
6144046
Link To Document :
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