• DocumentCode
    3409076
  • Title

    Development of on-line diagnosis system using intelligent devices for semiconductor equipment

  • Author

    Noguchi, T. ; Aizono, T. ; Kawano, K. ; Ohashi, M. ; Kogure, M.

  • Author_Institution
    Syst. Dev. Lab., Hitachi Ltd., Kanagawa, Japan
  • Volume
    5
  • fYear
    2002
  • fDate
    5-7 Aug. 2002
  • Firstpage
    3246
  • Abstract
    To enable safe, profitable LSI manufacture, semiconductor equipment must be reliable. Equipment failure can cause serious problems, such as an explosion in the chamber, which can stop the fabrication line for a long time. Such problems arise because potential equipment failure cannot be detected in advance. To remedy this, we have developed an on-line detection system that incorporates intelligent devices, such as sensors and actuators, the CPU and communication interface of which enable on-line self-diagnosis.
  • Keywords
    built-in self test; condition monitoring; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; intelligent actuators; intelligent sensors; CPU; actuators; communication interface; equipment failure; intelligent devices; online diagnosis system; online self-diagnosis; profitable LSI manufacture; reliability; semiconductor equipment; sensors; Equipment failure; Explosions; Fabrication; Intelligent actuators; Intelligent manufacturing systems; Intelligent sensors; Intelligent systems; Large scale integration; Semiconductor device manufacture; Semiconductor device reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SICE 2002. Proceedings of the 41st SICE Annual Conference
  • Print_ISBN
    0-7803-7631-5
  • Type

    conf

  • DOI
    10.1109/SICE.2002.1195635
  • Filename
    1195635