DocumentCode
3409076
Title
Development of on-line diagnosis system using intelligent devices for semiconductor equipment
Author
Noguchi, T. ; Aizono, T. ; Kawano, K. ; Ohashi, M. ; Kogure, M.
Author_Institution
Syst. Dev. Lab., Hitachi Ltd., Kanagawa, Japan
Volume
5
fYear
2002
fDate
5-7 Aug. 2002
Firstpage
3246
Abstract
To enable safe, profitable LSI manufacture, semiconductor equipment must be reliable. Equipment failure can cause serious problems, such as an explosion in the chamber, which can stop the fabrication line for a long time. Such problems arise because potential equipment failure cannot be detected in advance. To remedy this, we have developed an on-line detection system that incorporates intelligent devices, such as sensors and actuators, the CPU and communication interface of which enable on-line self-diagnosis.
Keywords
built-in self test; condition monitoring; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; intelligent actuators; intelligent sensors; CPU; actuators; communication interface; equipment failure; intelligent devices; online diagnosis system; online self-diagnosis; profitable LSI manufacture; reliability; semiconductor equipment; sensors; Equipment failure; Explosions; Fabrication; Intelligent actuators; Intelligent manufacturing systems; Intelligent sensors; Intelligent systems; Large scale integration; Semiconductor device manufacture; Semiconductor device reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN
0-7803-7631-5
Type
conf
DOI
10.1109/SICE.2002.1195635
Filename
1195635
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