Title :
Development of on-line diagnosis system using intelligent devices for semiconductor equipment
Author :
Noguchi, T. ; Aizono, T. ; Kawano, K. ; Ohashi, M. ; Kogure, M.
Author_Institution :
Syst. Dev. Lab., Hitachi Ltd., Kanagawa, Japan
Abstract :
To enable safe, profitable LSI manufacture, semiconductor equipment must be reliable. Equipment failure can cause serious problems, such as an explosion in the chamber, which can stop the fabrication line for a long time. Such problems arise because potential equipment failure cannot be detected in advance. To remedy this, we have developed an on-line detection system that incorporates intelligent devices, such as sensors and actuators, the CPU and communication interface of which enable on-line self-diagnosis.
Keywords :
built-in self test; condition monitoring; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; intelligent actuators; intelligent sensors; CPU; actuators; communication interface; equipment failure; intelligent devices; online diagnosis system; online self-diagnosis; profitable LSI manufacture; reliability; semiconductor equipment; sensors; Equipment failure; Explosions; Fabrication; Intelligent actuators; Intelligent manufacturing systems; Intelligent sensors; Intelligent systems; Large scale integration; Semiconductor device manufacture; Semiconductor device reliability;
Conference_Titel :
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN :
0-7803-7631-5
DOI :
10.1109/SICE.2002.1195635