Title :
Reliability improvement in multicore architectures through computing in embedded memory
Author :
Hajimiri, Hadi ; Paul, Sudipta ; Ghosh, A. ; Bhunia, Swarup ; Mishra, P.
Abstract :
Nanoscale devices provide the capability of gigascale integration in modern electronic systems. However, such systems suffer from high defect rates and large parametric variations that can adversely affect system reliability. Hardware duplication is an obvious direction but it incurs significant area overhead that is unacceptable in many scenarios. Memory-based computing (MBC) is a promising alternative to improve overall system reliability when few functional units are defective or unreliable under process-induced or thermal variations. Existing works demonstrated the utility of MBC in single-core based designs. In this paper, we explore the effectiveness of MBC in multicore architectures where each core uses a small private cache while a set of cores share a large second-level cache. The private as well as shared caches are used to perform computation on demand using a lookup table. When a functional unit fails, temporarily due to temperature induced variations or permanently, the associated computation is transferred to caches. Experimental results demonstrate that on-demand memory based computing can significantly improve reliability with minor loss in performance.
Keywords :
cache storage; embedded systems; integrated circuit reliability; multiprocessing systems; table lookup; embedded memory; gigascale integration; hardware duplication; lookup table; modern electronic systems; multicore architectures; nanoscale devices; on-demand memory-based computing; process-induced; reliability; second-level cache; single-core based designs; small private cache; thermal variations; Analytical models; CMOS integrated circuits; Computational modeling; Heating; Reliability; Semiconductor device modeling; Table lookup;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026672