Title :
Analysis of the wavelet-based image difference algorithm for PCB inspection
Author :
Ibrahim, Z. ; Al-Attas, S.A.R. ; Aspar, Z.
Author_Institution :
Dept. of Microelectron. & Comput. Eng., Universiti Teknologi Malaysia, Johor, Malaysia
Abstract :
The methodology and results regarding the use of wavelet transform and multiresolution analysis in automated visual printed circuit board (PCB) inspection provide the motivation for this research. In the paper, the wavelet-based image difference algorithm proposed is applied to a sample PCB image. The algorithm is applied by using a Haar wavelet where several different numbers of levels are considered. One conclusion from this paper is that the second level Haar wavelet transform should be selected for the application of visual PCB inspection.
Keywords :
Haar transforms; automatic optical inspection; printed circuit manufacture; wavelet transforms; Haar wavelet; PCB inspection; automated visual printed circuit board inspection; industrial inspection; multiresolution analysis; wavelet transform; wavelet-based image difference algorithm; Algorithm design and analysis; Image analysis; Inspection; Logic; Multiresolution analysis; Pixel; Printed circuits; Testing; Wavelet analysis; Wavelet transforms;
Conference_Titel :
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN :
0-7803-7631-5
DOI :
10.1109/SICE.2002.1195721
