• DocumentCode
    3409571
  • Title

    Beam characterizations of mass separated, low-energy positive and negative ions deposition apparatus

  • Author

    Tsubouchi, N. ; Horino, Y. ; Wada, M. ; Oomori, H.

  • Author_Institution
    Dept. of Mater. Phys., Osaka Nat Res. Inst., Japan
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    350
  • Abstract
    The authors study properties of positive and negative ion beams mainly focused on the characterizations of the ion beam energy on a newly developed apparatus for isotopically mass separated, low-energy, positive and negative ions deposition. In the positive ion beam line, a plasma potential inside the ion source was about 50 to 100 V, depending on a gas pressure, a magnetron power and an applied magnetic field. It decreased with the increasing gas pressure and with decreasing the microwave power and the magnetic field. The energy spread (full width at half maximum) was about 8-10 eV almost independent of various parameters, for example, the gas pressure, ion species, etc. The fluctuation of the beam energy was about a few eV during ten hours
  • Keywords
    ion beam assisted deposition; ion beams; ion sources; negative ions; positive ions; 50 to 100 V; 50 to 350 V; beam characterizations; ion beams; ion source; low-energy negative ions deposition apparatus; low-energy positive ions deposition apparatus; mass separated apparatus; plasma potential; Fault location; Fluctuations; Ion beams; Ion sources; Magnetic fields; Magnetic separation; Physics; Plasma properties; Plasma sources; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1999.812125
  • Filename
    812125