• DocumentCode
    3409623
  • Title

    Robust sensorless control of a PMSM bearingless pump

  • Author

    Raggl, K. ; Warberger, B. ; Nussbaumer, T. ; Burger, S. ; Kolar, J.W.

  • Author_Institution
    Power Electron. Syst. Lab., ETH Zurich, Zurich
  • fYear
    2008
  • fDate
    June 30 2008-July 2 2008
  • Firstpage
    538
  • Lastpage
    545
  • Abstract
    In semiconductor industry, where bearingless pump systems are employed already as state-of-the-art technology, the trend goes towards higher fluid temperatures (150degC and more) in order to further increase process efficiency. This fact translates to the requirement of a high.temperature bearingless pump system and/or the elimination of thermal-critical components such as hall sensors. This paper introduces a new method for a hall-sensorless control of a PMSM bearingless pump in its operating range from 0 rpm to 8000 rpm and from zero load to full load. The sensorless operation is performed by three novel control functionalities, namely: a controlled start-up routine, enabling a sure levitation and zero angle setting; an open-loop angle estimation based on stator voltage and stator current measurement and known machine parameters; and an angle synchronization establishing a robust operation of the pump in the whole operating range even for a large machine parameter drift. Especially, considering the temperature degrading of the permanent magnet flux density, the novel robust control concept is of great benefit for bearingless pump systems employed in high temperature applications.
  • Keywords
    pumps; robust control; sensors; PMSM bearingless pump; bearingless pump systems; hall sensors; robust sensorless control; semiconductor industry; thermal-critical components; Electronics industry; Open loop systems; Pumps; Robust control; Sensor systems; Sensorless control; Stators; Temperature sensors; Thermal sensors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-1665-3
  • Electronic_ISBN
    978-1-4244-1666-0
  • Type

    conf

  • DOI
    10.1109/ISIE.2008.4676988
  • Filename
    4676988