• DocumentCode
    3409697
  • Title

    Empirical mode decomposition based interest point detector

  • Author

    Khan, Jesmin F. ; Adhami, Reza R. ; Bhuiyan, Sharif M A ; Barner, Kenneth E.

  • Author_Institution
    Dept. of ECE, Alabama Univ.-Huntsville, Huntsville, AL
  • fYear
    2008
  • fDate
    March 31 2008-April 4 2008
  • Firstpage
    1317
  • Lastpage
    1320
  • Abstract
    A novel method based on empirical mode decomposition (EMD) is introduced in this paper for the detection of affine invariant interest or feature points. The proposed algorithm is a contour based method, where image edges are first detected by utilizing morphological operators followed by an edge thinning process and then the corner or interest points are identified based on the local curvature of the edges. In this work a novel method based on 1-D EMD is formulated to select good discriminative interest points from the edges. The proposed method is compared with four existing approaches that yield good results. The performance is evaluated by employing a criteria known as repeatability rate, which evaluates the geometric stability of an interest point detector under different transformations. The results prove the efficacy and superiority of the proposed technique over other schemes in terms of detecting more true corner points.
  • Keywords
    edge detection; geometry; image thinning; mathematical morphology; affine invariant interest detection; contour based method; edge thinning process; empirical mode decomposition; geometric stability; image edge detection; interest point detector; morphological operators; repeatability rate; Computer vision; Detectors; Frequency; Image edge detection; Morphological operations; Object detection; Parametric statistics; Robustness; Stability criteria; Wavelet transforms; Empirical mode decomposition; intrinsic mode function; morphological operations; wavelet decomposition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-1483-3
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2008.4517860
  • Filename
    4517860