DocumentCode :
3410019
Title :
Learning based alpha matting using support vector regression
Author :
Zhanpeng Zhang ; Qingsong Zhu ; Yaoqin Xie
Author_Institution :
Shenzhen Inst. of Adv. Technol., Shenzhen, China
fYear :
2012
fDate :
Sept. 30 2012-Oct. 3 2012
Firstpage :
2109
Lastpage :
2112
Abstract :
Alpha matting refers to the problem of estimating the opacity mask of the foreground in an image. Many recent algorithms solve it with color samples or some local assumptions, causing artifacts when they fail to collect appropriate samples or the assumptions do not hold. In this paper, we treat alpha matting as a supervised learning problem and propose a new matting approach. Given the input image and a trimap (labeling some foreground/background pixels), we segment the unlabeled region into pieces and learn the relations between pixel features and alpha values for these pieces. We use support vector regression (SVR) in the learning process. To obtain better learning results, we design a training samples selection method and use adaptive parameters for SVR. Qualitative and quantitative evaluations on a matting benchmark show that our approach outperforms many recent algorithms in terms of accuracy.
Keywords :
feature extraction; image colour analysis; image resolution; image segmentation; learning (artificial intelligence); regression analysis; support vector machines; SVR; alpha values; background pixels; color samples; foreground extraction; foreground pixels; image editing perations; image segmentation; learning based alpha matting; learning process; opacity mask estimation problem; pixel features; supervised learning problem; support vector regression; training samples selection method; trimap; unlabeled region; video editing perations; Benchmark testing; Image color analysis; Kernel; Measurement; Support vector machines; Training; Vectors; alpha matting; foreground extraction; image segmentation; support vector regression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
ISSN :
1522-4880
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2012.6467308
Filename :
6467308
Link To Document :
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