Title :
Fault Simulation for Typical Structures in the MEMS Gyro
Author :
Liu, Fengli ; Gao, Lianxing ; Hao, Yongping ; Zeng, Pengfei
Author_Institution :
Shenyang Agric. Univ., Shenyang
Abstract :
The fault in MEMS gyro always cause huge damage because it is often used in critical system. Failure mode and effect analysis can predict failure modes at an early stage of the MEMS gyro design. MEMS gyro is mainly composed of typical structures such as comb diver, parallel plate capacitor and cantilever. So this analysis is restricted to fault simulation in system level and components level for the typical structures and relies on integrating qualitative failure analysis and quantitative fault simulation.
Keywords :
failure analysis; fault simulation; micromechanical devices; MEMS gyro design; cantilever; comb diver; critical system; effect analysis; failure mode; parallel plate capacitor; qualitative failure analysis; quantitative fault simulation; Analytical models; Atmospheric modeling; Capacitors; Electrodes; Electrostatics; Fabrication; Failure analysis; Mechatronics; Micromechanical devices; Performance analysis; MEMS; reliability; simulation; typical structures;
Conference_Titel :
Mechatronics and Automation, 2007. ICMA 2007. International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-0828-3
Electronic_ISBN :
978-1-4244-0828-3
DOI :
10.1109/ICMA.2007.4304048